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(a) Schematic of the planar slot waveguide. (b) Experimental angle-resolved ATR spectra for sample S2. The angle of incidence increases in steps of 5°. The curves are vertically shifted for clarity. The experimental geometry used in the ATR measurements is shown in the inset.
Left panels: measured dispersion of TM (full circles) and TE (open circles) waveguide modes as derived from ATR spectra, compared to calculated dispersion (solid and dashed lines, respectively) for samples S1, S2, and S3. Dotted lines represent the light lines for air, , slot layer, and Si, respectively. Right panels: mode effective indices as derived from ATR measurements, compared to calculated ones.
Plot of calculated normalized field intensity in the slot waveguide S1 for (a) TE1 and TM1 modes at 0.8 eV and (b) TE2 and TM2 modes at 1.5 eV. Waveguide refractive index profile is also shown.
Room-temperature guided PL spectra of sample S2 for TE and TM polarizations. A schematic of the experimental geometry is also shown. Inset: spectrally integrated TM/TE ratio as a function of the distance .
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