1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Effect of thermal treatment on oxygen stoichiometry and transport properties of thin films
Rent:
Rent this article for
USD
10.1063/1.2408649
/content/aip/journal/apl/89/24/10.1063/1.2408649
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/24/10.1063/1.2408649
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

XRD scans of as-deposited and postannealed SRO films.

Image of FIG. 2.
FIG. 2.

(Color online) (a) profile of the Ar400 sample as an example. (b) Enlarged view of the NRERS peak in the profile shown in (a). (c) Oxygen content of SRO samples calculated from the area of the NRERS peaks. The curve is drawn as an eye guide. (d) Enlarged views of Sr, Ru, and Ti signals of the RBS profiles. The fitting curves for the ArO700 sample are overdrawn. (e) The depth profiles of Sr, Ru, and Ti contents of each sample that are drawn using the results of fitting.

Image of FIG. 3.
FIG. 3.

curves of all SRO films including the standard MOCVD film. The inset shows the resistivity at (circle) and (triangle) of Ar (filled)- and (open)-annealed samples plotted as a function of the annealing temperature.

Loading

Article metrics loading...

/content/aip/journal/apl/89/24/10.1063/1.2408649
2006-12-15
2014-04-24
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Effect of thermal treatment on oxygen stoichiometry and transport properties of SrRuO3 thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/24/10.1063/1.2408649
10.1063/1.2408649
SEARCH_EXPAND_ITEM