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(a) Normalized RHEED intensity oscillations during the growth of shallow quantum wells of varying thickness. (b) Schematic diagram of the heterostructures and AFM image of a typical surface morphology. The step height is , corresponding to the height of one perovskite unit cell. (c) Wide scan XPS spectrum of the sample (100).
(Color online) (a) O and V photoemission spectra of (, 2, 3, and 5) quantum well structures, normalized to the O peak height. (b) V photoemission spectra normalized to the V peak area. The bulk line is taken from Ref. 10, energy aligned by the O peak.
Angle-dependent XPS spectra for the V core level of the structure. Closed circles, solid lines, and dashed lines show the experimental data, the fitting curve, and the background of the spectra, respectively.
(a) Fractional area ratio of the peak to the total peak area of V core-level spectra as a function of the emission angle in the sample. Dashed lines represent the relative contribution of each layer to the total spectra. A best fit to the data corresponds to 75% in the first layer, with the rest , as shown in (b).
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