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(a) XRD scan plots of a thick LCMO thin film grown on STO (001) substrate. The inset shows the rocking curve for the (004) peak of LCMO film. (b) scan of the (103) pseudocubic subcell reflections of the LCMO thin film (top) and the STO (103) reflections of the substrate (bottom).
XPS measurements of the LCMO thin film sample: (a) valence band, (b) Co core level, (c) Mn core level, and (d) Mn core level.
Temperature dependence of the FC and ZFC responses of the sample measured in magnetic fields of (a) , (b) , (c) , and (d) .
hysteresis loops of the sample measured at different temperatures.
Time dependence of measured for at four different temperatures of 5, 50, 150, and .
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