banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Structural properties of SrO thin films grown by molecular beam epitaxy on substrates
Rent this article for
View: Figures


Image of FIG. 1.
FIG. 1.

(Color online) RHEED images of the substrate and SrO film. (A) and (B) are taken on the substrate along the and azimuths, respectively. (C)–(H) are taken on SrO film after different numbers of SrO monolayers (ML) have been deposited: (C) 5 ML, (D) 10 ML, (E) 50 ML, (F) 100 ML, (G) and (H) 300 ML. The azimuths of the SrO patterns are indicated in the images. Since epitaxy proceeds through the 45° in-plane rotation, the images taken along the [110] azimuth of SrO are taken with the electron beam along the same direction as for images taken along the [100] azimuth of .

Image of FIG. 2.
FIG. 2.

XRD scan registered for a SrO film grown on substrate. the inset demonstrates XRD -rocking curve registered from the (002) peak of the SrO film.

Image of FIG. 3.
FIG. 3.

XRD scans registered for the peak of the substrate (solid line) and the (111) peak of SrO film (dotted line).


Article metrics loading...


Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Structural properties of SrO thin films grown by molecular beam epitaxy on LaAlO3 substrates