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XRD pattern of the -axis oriented (top) and highly (117) oriented film (bottom).
Morphologies of the highly -axis oriented film (a) and highly (117) oriented film (b) measured by an atomic force microscope in tapping mode.
Hysteresis loops of the highly -axis oriented capacitor measured at various applied voltages: 11, 15, and .
Variations of and values of the capacitor are plotted as a function of the applied voltage. The inset shows hysteresis loops measured at various applied voltages ranging between 4 and .
Frequency dependence of dielectric constant and dielectric loss (a) and electrical fatigue characteristics (b) of capacitor. The switching voltage during the fatigue test is at a frequency of and the measurement voltage is .
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