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Poling current and applied electric field wave forms acquired in the case of partly exchanged LN sample.
Schematic view of the sample cross section (a) after Al patterning and PE and (b) after electric field periodic poling by planar liquid electrodes.
Optical microscope image of the reversed domain pattern on the face after HF etching.
Optical microscope image of the reversed domain pattern seen on the face (a) underneath the face; (b) at about depth into the crystal, and (c) underneath the unpatterned face.
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