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Thermal contributions to the bending of bimaterial cantilever sensors
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10.1063/1.2222346
/content/aip/journal/apl/89/3/10.1063/1.2222346
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/3/10.1063/1.2222346
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) MCS array of eight cantilevers is housed inside a sample cell sealed with a sapphire window. The bending of the cantilevers is measured via a beam deflection technique using a light-emitting diode light source and a position sensitive photodetector (PSD). A resistor foil heater and a thermoresistor (Pt100) are integrated into the sample cell. (b) Schematic representation of the capillary painting process. A glass capillary filled with polymer solution is lowered towards the MCS until a meniscus is formed (step 1). As the capillary horizontally moved along the length of the cantilever, a continuous layer of polymer solution is formed (step 2). After evaporation of the solvent, a thin polymer film remains on the top side of the MCS (step 3). The thickness of the dry film is changed between 2 and by changing the sliding speed between 750 and .

Image of FIG. 2.
FIG. 2.

Differential deflection changes as a function of cantilever temperature for a PS coated MCS with (diamond), (triangle), and (circle) coating thicknesses. For comparison the average deflection of two uncoated MCSs is plotted (star).

Image of FIG. 3.
FIG. 3.

Differential deflection per unit temperature increase vs film thickness of the PS coating.

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/content/aip/journal/apl/89/3/10.1063/1.2222346
2006-07-19
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Thermal contributions to the bending of bimaterial cantilever sensors
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/3/10.1063/1.2222346
10.1063/1.2222346
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