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Special cantilever geometry for the access of higher oscillation modes in atomic force microscopy
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10.1063/1.2226993
/content/aip/journal/apl/89/3/10.1063/1.2226993
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/3/10.1063/1.2226993
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Results of the ANSYS simulation of cantilevers with a modified geometry. (a) Ratio of the resonance frequencies of the first and second oscillation modes for a variation of the lengths of a wider anchored part and a narrower free end of the cantilever. A minimum in is observed for . (b) Resonance frequency ratio for a variation of the width of the anchored part of a cantilever consisting of two equally long parts . The inset shows the oscillation modes.

Image of FIG. 2.
FIG. 2.

(Color online) Frequency spectrum of a cantilever with modified geometry (parameters are given in the figure) using an AFM in ambient air, an excitation amplitude of , and a gain of 30. The fundamental resonance mode is at and the second mode at , resulting in a ratio .

Image of FIG. 3.
FIG. 3.

UHV-KPFM image of on HOPG. (a) The topography (gray ) shows several surface steps and (b) the CP image (gray ) shows a clear contrast between (bright contrast) and HOPG (dark contrast).

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/content/aip/journal/apl/89/3/10.1063/1.2226993
2006-07-18
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Special cantilever geometry for the access of higher oscillation modes in atomic force microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/3/10.1063/1.2226993
10.1063/1.2226993
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