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Engineering patterns of Co nanoclusters on thin film using scanning tunneling microscopy manipulation techniques
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View: Figures


Image of FIG. 1.
FIG. 1.

(Color online) STM images illustrating removal of the Co clusters by reducing the bias during scanning. (a) STM image of Co clusters grown on ordered surface . (b) Zoom in of the area shown by the square in (a). The bias was reduced to different values as indicated in the figure during scanning. (c) STM image of the same surface region as in (a) after zoom out . The inset cartoon illustrates the procedure.

Image of FIG. 2.
FIG. 2.

(Color online) The cluster patterns tailored by the STM manipulation technique. Creation of void or cavity in the pattern by removing the specific Co clusters. (a) before and (b) after removal of the clusters. Fabrication of cluster chains by trimming a long Co clusters chain on a crystalline strip. [(c) and (d)] before and (e) after trimming the chain. (f) STM image for the rectangular cluster chains cut by removing sections of the chains. (g) STM image after removing rows of the Co clusters from the long cluster chains. and ) were used for the removal of the Co clusters and (, ) was used for the imaging.

Image of FIG. 3.
FIG. 3.

(Color online) The clusters unloaded from the tip to the surface. Relocation of the specific cluster from the crystalline to the amorphous region. (a) before picking up the cluster and (b) after relocating it on the amorphous region. The cluster is indicated by the circle. The inset manifests the creation of void after removing the specific cluster. (c) STM image for a number of Co clusters released from the tip. All the images were obtained at and .


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Engineering patterns of Co nanoclusters on thin film Al2O3∕NiAl(100) using scanning tunneling microscopy manipulation techniques