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(Color online) X-ray diffraction patterns of BNdT thin films with (a) predominant orientation (65%) and (b) predominant (001) orientation (50%). The peaks at , 61.74°, and 66.04° in (a) correspond to Pt , Si , and Si , respectively. The sharp peak denoted with an asterisk in Fig. 1(a), located at the position of the forbidden Si (200) peak at , is in fact the Si(400) peak originating from half the wavelength unintentionally passing the monochromator. The insets are x-ray pole figures recorded from the BNdT (117) reflection; the rim of the patterns corresponds to .
Cross-sectional TEM images of the BNdT films (a) with predominant orientation and (b) with predominant (001) orientation. The gap between the film and the bottom Pt electrode in (b) was formed during TEM specimen preparation.
(Color online) hysteresis loops of the film capacitors (a) with predominant orientation and (b) with predominant (001) orientation.
(Color online) Piezoelectric hysteresis loops of the film capacitors corresponding to those in Fig. 3.
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