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Anisotropic ferro- and piezoelectric properties of sol-gel-grown films with two different orientations on
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10.1063/1.2335409
/content/aip/journal/apl/89/6/10.1063/1.2335409
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/6/10.1063/1.2335409
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) X-ray diffraction patterns of BNdT thin films with (a) predominant orientation (65%) and (b) predominant (001) orientation (50%). The peaks at , 61.74°, and 66.04° in (a) correspond to Pt , Si , and Si , respectively. The sharp peak denoted with an asterisk in Fig. 1(a), located at the position of the forbidden Si (200) peak at , is in fact the Si(400) peak originating from half the wavelength unintentionally passing the monochromator. The insets are x-ray pole figures recorded from the BNdT (117) reflection; the rim of the patterns corresponds to .

Image of FIG. 2.
FIG. 2.

Cross-sectional TEM images of the BNdT films (a) with predominant orientation and (b) with predominant (001) orientation. The gap between the film and the bottom Pt electrode in (b) was formed during TEM specimen preparation.

Image of FIG. 3.
FIG. 3.

(Color online) hysteresis loops of the film capacitors (a) with predominant orientation and (b) with predominant (001) orientation.

Image of FIG. 4.
FIG. 4.

(Color online) Piezoelectric hysteresis loops of the film capacitors corresponding to those in Fig. 3.

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/content/aip/journal/apl/89/6/10.1063/1.2335409
2006-08-07
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Anisotropic ferro- and piezoelectric properties of sol-gel-grown Bi3.15Nd0.85Ti3O12 films with two different orientations on Pt∕Ti∕SiO2∕Si
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/6/10.1063/1.2335409
10.1063/1.2335409
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