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In situ electrode manipulation for three terminal field emission characterization of individual carbon nanotubes
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10.1063/1.2335604
/content/aip/journal/apl/89/6/10.1063/1.2335604
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/6/10.1063/1.2335604
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Figures

Image of FIG. 1.
FIG. 1.

(a) Scanning electron microscope image of the experimental setup. Anode electrode is seen at the top of the image, from the CNT. The gate electrode is positioned above the CNT tip. The inset shows a view down the inside of the gate electrode and shows the hole clearly. (b) SEM image of the gate electrode positioned above the CNT emitter.

Image of FIG. 2.
FIG. 2.

(a) Anode current against anode voltage for gate biases of 0 (∎), 5 (◻), 10 (●), 15 (엯tm), 20 (▴), and (▵). Emission with gate removed is also shown (∗). (b) Fowler-Nordheim analysis of the data of (a).

Image of FIG. 3.
FIG. 3.

(a) Variation of gate current against gate voltage for three different anode voltages: (∎) 0, (엯) 500, and (▴) . (b) Ratio of anode current to gate current plotted against anode voltage for gate biases of 0 (∎), 5 (◻), 10 (●), 15 (엯), 20 (▴), and (▵). Up to the ratio is between 0.1 and 100; however, at and the structure is emitting, this ratio exceeds .

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/content/aip/journal/apl/89/6/10.1063/1.2335604
2006-08-08
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: In situ electrode manipulation for three terminal field emission characterization of individual carbon nanotubes
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/6/10.1063/1.2335604
10.1063/1.2335604
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