Full text loading...
(a) Scanning electron microscope image of the experimental setup. Anode electrode is seen at the top of the image, from the CNT. The gate electrode is positioned above the CNT tip. The inset shows a view down the inside of the gate electrode and shows the hole clearly. (b) SEM image of the gate electrode positioned above the CNT emitter.
(a) Anode current against anode voltage for gate biases of 0 (∎), 5 (◻), 10 (●), 15 (엯tm), 20 (▴), and (▵). Emission with gate removed is also shown (∗). (b) Fowler-Nordheim analysis of the data of (a).
(a) Variation of gate current against gate voltage for three different anode voltages: (∎) 0, (엯) 500, and (▴) . (b) Ratio of anode current to gate current plotted against anode voltage for gate biases of 0 (∎), 5 (◻), 10 (●), 15 (엯), 20 (▴), and (▵). Up to the ratio is between 0.1 and 100; however, at and the structure is emitting, this ratio exceeds .
Article metrics loading...