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Degradation mechanism of organic light-emitting device investigated by scanning photoelectron microscopy coupled with peel-off technique
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10.1063/1.2335825
/content/aip/journal/apl/89/6/10.1063/1.2335825
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/6/10.1063/1.2335825
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Figures

Image of FIG. 1.
FIG. 1.

(Color online) SPEM images for the peeled-off samples obtained at the C binding energy. A and B samples were degraded by bias voltage for and less than operation, respectively. As a reference, as-prepared sample C was used. The left side images were obtained at binding energy higher than those of right side images. A-1 and A-2 images were obtained from near the edge of and about away from the exploded area, respectively. B images were obtained away from the exploded area. Size and pixel numbers of the images are shown in the figure.

Image of FIG. 2.
FIG. 2.

(Color online) (a) Survey spectra obtained from the marked area in the Fig. 1. The spectra show that the bright area in the left side image is basically the and that of the right side image is the hole-transport layer. (b) C spectra obtained from the marked area in the Fig. 1. Each spectrum is comprised of two main components (x and o) and can be deconvoluted as shown in the figure. The x components are from negligible-charging effect. The o components are used to compare the changes of chemical structure.

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/content/aip/journal/apl/89/6/10.1063/1.2335825
2006-08-08
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Degradation mechanism of organic light-emitting device investigated by scanning photoelectron microscopy coupled with peel-off technique
http://aip.metastore.ingenta.com/content/aip/journal/apl/89/6/10.1063/1.2335825
10.1063/1.2335825
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