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Growth of single-crystalline nanowires with one- and two-nanocontact electrical characterizations
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10.1063/1.2428669
/content/aip/journal/apl/90/1/10.1063/1.2428669
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/1/10.1063/1.2428669
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Figures

Image of FIG. 1.
FIG. 1.

(a) SEM image of NWs. The inset shows a distribution of the widths of the NWs. (b) High-resolution TEM image of a single-crystalline NW with its corresponding selected-area electron diffraction pattern (inset).

Image of FIG. 2.
FIG. 2.

(a) Average width, (b) average length, and (c) length-to-width ratio of NWs as a function of growth time.

Image of FIG. 3.
FIG. 3.

(a) Schematic illustration of the TEM-STM technique. The TEM image (right) displays a one nanocontact for electrical characterization. (b) TEM-STM measured resistance as a function of of the NWs. The inset displays the curves for untreated (nonlinear) and treated (linear) nanocontacts.

Image of FIG. 4.
FIG. 4.

Two typical temperature dependent resistance curves obtained from two-nanocontact electrical characterizations on single NWs having bad (top) and good (bottom) nanocontacts. The inset shows SEM image of a NW with two electrodes.

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/content/aip/journal/apl/90/1/10.1063/1.2428669
2007-01-03
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Growth of single-crystalline RuO2 nanowires with one- and two-nanocontact electrical characterizations
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/1/10.1063/1.2428669
10.1063/1.2428669
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