Full text loading...
(a) SEM image of NWs. The inset shows a distribution of the widths of the NWs. (b) High-resolution TEM image of a single-crystalline NW with its corresponding selected-area electron diffraction pattern (inset).
(a) Average width, (b) average length, and (c) length-to-width ratio of NWs as a function of growth time.
(a) Schematic illustration of the TEM-STM technique. The TEM image (right) displays a one nanocontact for electrical characterization. (b) TEM-STM measured resistance as a function of of the NWs. The inset displays the curves for untreated (nonlinear) and treated (linear) nanocontacts.
Two typical temperature dependent resistance curves obtained from two-nanocontact electrical characterizations on single NWs having bad (top) and good (bottom) nanocontacts. The inset shows SEM image of a NW with two electrodes.
Article metrics loading...