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60° tilted-view SEM image showing rod-shaped InP nanowires.
Top-view SEM image of InP nanowires showing sidewall facets.
Nanowire height as a function of Au nanoparticle diameter.
TEM images showing development of stacking faults in progressively longer nanowires. (a) Short wire with no visible faults. [(b) and (c)] Longer wires with faults isolated near the wire tip. The scale bar of each image is .
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