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(Color online) (a) Schematic diagram of the optical delay line structure and experimental geometry, showing the in-plane patterning of the bus waveguide, delay racetrack, and layer structure of the wafer. Also indicated is the NLDC, for which the cross section of the simulated supermode is shown in the inset. Scanning electron micrographs of the ridge waveguide cross section and the top view NLDCs are shown in (b) and (c), respectively.
(Color online) Temporal response of the linear transmission through the optical delay line for TE polarization measured with the fast photodetector. The inset shows the autocorrelation of the pulse from the OPO (solid red line) compared to the impulse response measured on the fast photodetector (dotted blue line).
(Color online) Temporal traces for TE polarized transmission through the optical delay line for several incident peak intensities.
(Color online) (a) Peak amplitude for pulses in the fast channel (dashed blue line), the slow channel (dash dotted red line), and the total (solid black line) as a function of the incident peak intensity. (b) Transmission ratio for the fast and slow channels is plotted as a function of peak intensity.
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