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(a) Chemical structures of the used organic materials, a schematic diagram of the photovoltaic device structure, and the current density–voltage curves in dark (dash dot line) and under AM1.5G illumination (solid line) of the photovoltaic device with the structure . (b) Dark current (dash dot line) and photocurrent (solid line) density–voltage curves of the photovoltaic device with the same structure after heat treatment at in a glove box under nitrogen environment. The inset diagram shows the calculation of the series resistance of the heated device from the linear part of the dark curve.
UV-vis spectra of untreated tetracene film and tetracene film after heat treatment at in a glove box under nitrogen environment.
(Color online) (a) Atomic force microscope (AFM) image of untreated tetracene film. (b) AFM image of tetracene film after heat treatment at in a glove box under nitrogen environment.
Dark curve for hole only device (a) before heat treatment and (b) after heat treatment. The dark line is the fit to the experimental data using SCLC model.
X-ray diffraction analysis of tetracene films on glass substrate before and after heat treatment.
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