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Nanoscale quantitative stress mapping with atomic force microscopy
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10.1063/1.2712494
/content/aip/journal/apl/90/11/10.1063/1.2712494
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/11/10.1063/1.2712494
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) Scheme of the apparatus developed to induce stress at the base of a conventional AFM cantilever.

Image of FIG. 2.
FIG. 2.

(Color online) Dependence of the contact potential difference (CPD) and the photovoltage as a function of the induced strain.

Image of FIG. 3.
FIG. 3.

(Color online) CPD at the base of the microlever system as a function of the computed stress.

Image of FIG. 4.
FIG. 4.

(Color online) (a) Surface topography and (b) KPFM image of the edge of a strained membrane, the scale is of for the KPFM image. (c) Sketch of the method used to apply stress on the membrane; the solid line square indicates the location was the data were recorded. (d) Cross section of the KPFM data.

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/content/aip/journal/apl/90/11/10.1063/1.2712494
2007-03-14
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Nanoscale quantitative stress mapping with atomic force microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/11/10.1063/1.2712494
10.1063/1.2712494
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