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(a) SEM surface image of the films assembled on the MPTMS SAMs, the inset showing the SEM image of the corresponding cross section; (b) high-resolution TEM image of the nanorods, the inset showing the corresponding TEM and ED pattern.
Temperature dependences of the electrical resistivity (open square), the Seebeck coefficient (close circle), and the thermoelectric power factor (close triangle) for the assembled films on the MPTMS SAMs.
Temperature dependences of the carrier concentration (open square) and the carrier mobility (close circle) for the films assembled on the MPTMS SAMs.
Electrical resistivity , Seebeck coefficient , and power factor for the films in present work and other typical TE films at near room temperature.
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