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(a) MCD spectra of annealed measured in a reflection setup at when magnetic fields of (dotted black curve), (thin gray curve), and (thick black curve) were applied perpendicular to the film plane. (b) MCD spectra shown in (a) when normalized by the intensity at . (c) The MCD spectrum of with low of 0.074 at (Ref. 9).
(Color) Magnetic field dependence of MCD (left axis, color curves) and of Hall resistance (right axis, black curves) of annealed measured at 30, 90, 130, and . The magnetic field was applied perpendicular to the film plane. The MCD measurements were carried out with photon energy of in a reflection setup. The inset (a) shows the magnetization vs temperature curve of the annealed film measured by SQUID with a weak magnetic field of applied in plane along the  axis. The inset (b) shows the Arrott plot ( vs ) obtained by the anomalous Hall effect data at 156, 165, 168, and .
Temperature dependence of resistivity of as-grown (thin curves) and annealed (bold curves) with of 12.2%, 15.2%, 17.6%, and 21.3%. Note that the data of the annealed samples with and 15.2% are almost overlapped.
Growth and annealing conditions, , and per Mn atom of the heavily Mn-doped samples examined in this letter. Here, , , , , and are the thickness of the GaMnAs layer, the growth temperature, the annealing temperature, the annealing time, and the magnetization of the annealed GaMnAs samples measured by SQUID at , respectively. The values were estimated by the anomalous Hall effect measurements. The description of “” in the item means that we could not estimate the exact value because the resistivity was too high to measure in our measurement setup. means that is divided by the number of the Mn atoms doped in the sample used for the SQUID measurements.
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