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(Color online) (a) FDTD visualization of silicon photonic crystal with air holes, with integrated waveguide for fiber-based characterization, showing field profile of cavity mode at slab center; (b) at slab surface.
(Color online) [(a) and (b)] Scanning electron microscope images of fabricated silicon devices. (a) with lateral detunings of , , and for three holes adjacent to the cavity, center hole of radius . (b) Angled view of typical silicon on insulator device. The scale bar represents in (a) and in (b). . (c) Schematic of the imaging/characterization system. A Ti:sapphire pump is used for the PL measurements to determine QD-cavity coupling (step 1: solid lines). For cold-cavity characterization (step 2: dotted lines), a tunable laser source (TLS) is coupled to the chip through lensed fibers (LF) and integrated waveguides. The samples are mounted on translation stages and the radiation collected through a objective lens (OL), telescope system, and long pass filter (LPF).
(Color online) (a) Cold-cavity modes characterized using tunable laser after PMMA coating for (i) , detuning, ; ; (ii) detuning, , after selective PMMA removal; , ; and (iii) detuning , ; , and ; . (b) Coupling measurements ( axis arbitrarily shifted): (I) background PL; [(II)–(IV)] coupling measurements corresponding to cold-cavity characterization in (a-i)–(a-iii), respectively. Measured coupled resonances at (II) , (III) , and (IV) . (c) Normalized cavity spectrum for the cavity in (b)-II. (d) Polarization coupling measurements for , . .
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