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Thickness dependence of in-plane dielectric and ferroelectric properties of thin films epitaxially grown on
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10.1063/1.2716865
/content/aip/journal/apl/90/13/10.1063/1.2716865
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/13/10.1063/1.2716865
/content/aip/journal/apl/90/13/10.1063/1.2716865
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/content/aip/journal/apl/90/13/10.1063/1.2716865
2007-03-26
2014-12-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Thickness dependence of in-plane dielectric and ferroelectric properties of Ba0.7Sr0.3TiO3 thin films epitaxially grown on LaAlO3
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/13/10.1063/1.2716865
10.1063/1.2716865
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