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External quantum efficiency (EQE) measurements of the best PF10TBT:[C60]PCBM photovoltaic cell at short circuit conditions and calculated internal quantum efficiency (IQE). The inset shows the current-voltage measurement of the same device in the dark (squares) and under simulated AM1.5 illumination (solid line). Also shown is the molecular structure of PF10TBT.
(a) Ellipsometry parameters and as a function of wavelength for a thick film of PF10TBT:[C60]PCBM on quartz; experimental data (solid line) and the fit of the dispersion model (squares). (b) Refractive index (top) and extinction coefficient (bottom) as derived from ellipsometry measurements for PF10TBT (solid line), C60-PCBM (dashed line), and a 1:4 blend of PF10TBT:[C60]PCBM (dotted line).
Absorption distribution within the active layer of a PF10TBT:[C60]PCBM photovoltaic solar cell for various wavelengths of the incident light.
Top: Measured (circles) and calculated (squares) short circuit current as a function of PF10TBT:[C60]PCBM film thickness. For the calculations, the film thickness of the PEDOT:PSS and blend films of the actual devices was used. Bottom: Total internal quantum efficiency as a function of layer thickness.
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