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Thermal annealing effects on the electrical characteristics of the back interface in nano-silicon-on-insulator channel
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10.1063/1.2719641
/content/aip/journal/apl/90/14/10.1063/1.2719641
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/14/10.1063/1.2719641
/content/aip/journal/apl/90/14/10.1063/1.2719641
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/content/aip/journal/apl/90/14/10.1063/1.2719641
2007-04-04
2014-09-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Thermal annealing effects on the electrical characteristics of the back interface in nano-silicon-on-insulator channel
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/14/10.1063/1.2719641
10.1063/1.2719641
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