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Focused-ion-beam-directed nucleation of InAs quantum dots
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10.1063/1.2724927
/content/aip/journal/apl/90/16/10.1063/1.2724927
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/16/10.1063/1.2724927
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Tapping mode AFM of FIB patterned square on GaAs buffer ML GaAs.

Image of FIG. 2.
FIG. 2.

Tapping AFM of 2.0 ML InAs grown on FIB patterned regions with an ion dose of .

Image of FIG. 3.
FIG. 3.

Plot of QD density vs ion dose (open circles). Plot of roughness vs dose for patterned GaAs Buffer layer (solid squares).

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/content/aip/journal/apl/90/16/10.1063/1.2724927
2007-04-17
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Focused-ion-beam-directed nucleation of InAs quantum dots
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/16/10.1063/1.2724927
10.1063/1.2724927
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