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XRD results for the structural changes in GST and NGST films with nitrogen contents of (a) 0%, (b) 5%, (c) 17%, and (d) 26%.
(Color online) HR-XPS spectra of (a) Ge , (b) Sb , and (c) Te of GST films which were as grown and annealed at the temperatures of 220 and .
(Color online) HR-XPS spectra of Ge of NGST films with various nitrogen contents (a) as grown and (b) annealed at a temperature of .
(Color online) (a) plots of GST films where the intercept of the abscissa indicates the optical band gap . (b) Changes in the optical band gap of GST and NGST films as functions of the amount of incorporated nitrogen and annealing temperature.
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