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Photoluminescence properties of films deposited by radio frequency magnetron cosputtering
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10.1063/1.2735284
/content/aip/journal/apl/90/18/10.1063/1.2735284
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/18/10.1063/1.2735284
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) Typical XRD pattern of a textured film deposited on glass substrate and its corresponding 001 inverse pole figure (bottom-right insert) exhibiting a strong ⟨111⟩ fiber texture (27 multiple of a random distribution). Pole locations are indicated by their Miller indices. Equal area projection and linear distribution density scale. RT Raman spectrum of film deposited on glass substrate (top insert).

Image of FIG. 2.
FIG. 2.

(a) PL spectra of a film deposited on glass substrate (solid line) and of a reference bulk crystal (dotted line) under a excitation at RT. (b) PL spectra of the same film at lower temperatures. The sharp emission line at about comes from the Ti:sapphire laser (third order of the monochromator grating) and the emission line at about is due to water vapor absorption.

Image of FIG. 3.
FIG. 3.

PL spectra at of a film deposited on GaAs substrate under (dotted line) and multiline argon laser (solid line) excitation.

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/content/aip/journal/apl/90/18/10.1063/1.2735284
2007-05-01
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Photoluminescence properties of Cr2+:ZnSe films deposited by radio frequency magnetron cosputtering
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/18/10.1063/1.2735284
10.1063/1.2735284
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