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Panoramic view of the spontaneous emission spectrum generated by mixtures in the , microcavity discussed in Ref. 7 as well as in the text. The spectral resolution of the detection system is in first order, and the inset shows the band at the maximum available resolution. The positions of several terms of the , , and branches are also indicated.
(Color) Dependence of the rotational temperature on the partial pressure for vapor mixtures excited in the microcavity of Fig. 1. The estimated uncertainty in these values of inferred from spectra is . The inset compares experimental (black curve) and simulated spectra for mixtures. Computed band profiles are presented for (red), (green), and (blue).
Partial energy level diagram for the OH radical and the excimer, portraying only the lowest electronic excited states of both molecules. For convenience, the bound states are represented by Morse potentials and the OH and states have been displaced vertically by the H–OH bond energy.
(Color) Emission spectra in the wavelength region, produced by Ne/(0.5%–5%) and Ar/0.5% gas mixtures in arrays of Si microcavity plasma devices. For all measurements, the total gas pressure was maintained at and the spectra were recorded by viewing the array through a quartz window.
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