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X-ray diffraction scans of the as-deposited BTO/Ni thin film.
TEM characterization of BTO film on Ni substrate. (a) Plan-view TEM with the inset electron diffraction pattern of BTO film. (b) Cross-sectional TEM of BTO/Ni (with the inset of a low magnification image) showing the nanopillars and interface structure.
(Color online) Piezoelectric responsive microscope image of the ferroelectric thin films on Ni tape.
Hysteresis loop measurement of ferroelectric thin films on Ni tape with NiO buffered interface.
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