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based metal-semiconductor-metal ultraviolet photodetectors
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10.1063/1.2741128
/content/aip/journal/apl/90/20/10.1063/1.2741128
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/20/10.1063/1.2741128
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

XRD pattern of a thin film annealed at by sol-gel method.

Image of FIG. 2.
FIG. 2.

characteristics of MSM photodetectors under different UV light wavelengths.

Image of FIG. 3.
FIG. 3.

Spectral response of the MSM photodetectors with Au Schottky contacts.

Image of FIG. 4.
FIG. 4.

Time response of the devices measured under the irradiation of a deuterium lamp at bias. An oscilloscope was used to record the voltage change of the series resistance of .

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/content/aip/journal/apl/90/20/10.1063/1.2741128
2007-05-18
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: TiO2 based metal-semiconductor-metal ultraviolet photodetectors
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/20/10.1063/1.2741128
10.1063/1.2741128
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