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X-ray diffraction scans of As-grown PBCO/STO thin film.
Cross sectional TEM studies show the crystallinity and epitaxial behavior of the as-grown PBCO thin film on STO (top). SAED pattern taken only in the area covering the film, indicating the film has excellent single crystallinity (inset in top). High resolution TEM image shows the interfacial structure and epitaxial quality of the film (bottom).
(Color online) Temperature dependence of resistance in the field of 0 and for (a) as-grown film and (b) after-annealing film.
MR of thin films as a function of the applied fields for (a) as-grown sample and for (b) after-annealing sample at registered temperatures.
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