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In situ treatment of a scanning gate microscopy tip
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10.1063/1.2742314
/content/aip/journal/apl/90/21/10.1063/1.2742314
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/21/10.1063/1.2742314

Figures

Image of FIG. 1.
FIG. 1.

(Color online) [(a)–(g)] Scanning gate measurements that show the current through a quantum dot as a function of tip position. Lines of high current are equipotential lines of the tip-induced potential. (a) Tip-induced potential recorded after first cooling down the microscope. In (b)–(g) we can see how the tip-induced potential changed due to the high-field treatment. We also show SEM images of the tip before (i) and after (h) the measurement cycle.

Tables

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Table I.

Parameters used for the successive high-field treatments of the tip. is the tip bias used in STM mode with a current set point while is the tip bias used for cleaning.

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/content/aip/journal/apl/90/21/10.1063/1.2742314
2007-05-24
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: In situ treatment of a scanning gate microscopy tip
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/21/10.1063/1.2742314
10.1063/1.2742314
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