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scan of the ZnO (0002) diffraction peak for samples A and B. The intensity was normalized with respect to the highest intensity of the peak.
(Color online) Cross-sectional TEM image of sample A and its relevant structure schematics.
XRD pattern of sample B measured at small incident angle (solid line) and its simulated curve (dotted line).
(Color online) Measurements and analysis of PL in MQWs; (a) low temperature PL spectra as measured from sample B and ZnO substrate; (b) temperature dependence PL of sample B in a temperature range of ; (c) the energy shift of the localized exciton emission in sample B as a function of temperature, the insert shows the energy band diagram of MQW structure for the well width of . All the PL intensities were normalized with respect to the highest intensity of the peak.
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