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(Color online) Topographic (a) AFM image close to an indentation made in the GaAs sample and (b) simultaneously acquired EBIC image for , , and .
(Color online) Topographic (a) AFM image of QDs covered with a thick GaAs layer and (b) simultaneously acquired EBIC image. The arrows in image (a) indicate the position of small craters (the QDs) in the middle of the ringlike structures.
Comparison of the normalized induced current for the GaAs sample without QDs and the GaAs sample containing InAs QDs.
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