No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Kelvin probe force microscopy study of surface potential transients in cleaved high electron mobility transistors
1.Y. Okamoto, Y. Ando, K. Hataya, T. Nakayama, H. Miyamoto, T. Inoue, M. Senda, K. Hirata, M. Kosaki, N. Shibata, and M. Kuzuhara, IEEE Trans. Microwave Theory Tech. 52, 2536 (2004).
5.T. Mizutani, T. Okino, K. Kawada, Y. Ohno, S. Kishimoto, and K. Maezawa, Phys. Status Solidi A 200, 195 (2003).
Article metrics loading...
Full text loading...
Most read this month