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Kelvin probe force microscopy study of surface potential transients in cleaved high electron mobility transistors
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10.1063/1.2743383
/content/aip/journal/apl/90/21/10.1063/1.2743383
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/21/10.1063/1.2743383
/content/aip/journal/apl/90/21/10.1063/1.2743383
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/content/aip/journal/apl/90/21/10.1063/1.2743383
2007-05-25
2014-10-02
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Kelvin probe force microscopy study of surface potential transients in cleaved AlGaN∕GaN high electron mobility transistors
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/21/10.1063/1.2743383
10.1063/1.2743383
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