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(Color online) [(a)–(c)] AFM topographic and (d) phase images for -thick films deposited on substrates kept at different : (a) 25, (b) 120, and (c) and (d) (all scale bars represents ).
(Color online) (a) 2D GIXRD patterns and (b) circular average x-ray profiles for -thick films deposited on substrates kept at different growth temperatures : 25, 120, and , respectively.
(Color online) (a) Room temperature output characteristic of the top contact/bottom gate OFET based on grown at with source/drain contact. Inset diagram shows the device architecture employed. (b) Room temperature subthreshold characteristic with subthreshold slope of /decade and linear mobility of . (c) Plot of vs for OFETs fabricated on films were grown at different . Transfer characteristics of these devices are shown in Ref. 6.
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