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Correlation of crystalline and structural properties of thin films grown at various temperature with charge carrier mobility
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10.1063/1.2743386
/content/aip/journal/apl/90/21/10.1063/1.2743386
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/21/10.1063/1.2743386
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) [(a)–(c)] AFM topographic and (d) phase images for -thick films deposited on substrates kept at different : (a) 25, (b) 120, and (c) and (d) (all scale bars represents ).

Image of FIG. 2.
FIG. 2.

(Color online) (a) 2D GIXRD patterns and (b) circular average x-ray profiles for -thick films deposited on substrates kept at different growth temperatures : 25, 120, and , respectively.

Image of FIG. 3.
FIG. 3.

(Color online) (a) Room temperature output characteristic of the top contact/bottom gate OFET based on grown at with source/drain contact. Inset diagram shows the device architecture employed. (b) Room temperature subthreshold characteristic with subthreshold slope of /decade and linear mobility of . (c) Plot of vs for OFETs fabricated on films were grown at different . Transfer characteristics of these devices are shown in Ref. 6.

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/content/aip/journal/apl/90/21/10.1063/1.2743386
2007-05-25
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Correlation of crystalline and structural properties of C60 thin films grown at various temperature with charge carrier mobility
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/21/10.1063/1.2743386
10.1063/1.2743386
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