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Band discontinuity measurements of the wafer bonded heterojunction
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10.1063/1.2745254
/content/aip/journal/apl/90/22/10.1063/1.2745254
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/22/10.1063/1.2745254
/content/aip/journal/apl/90/22/10.1063/1.2745254
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/content/aip/journal/apl/90/22/10.1063/1.2745254
2007-05-31
2014-09-01
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Band discontinuity measurements of the wafer bonded InGaAs∕Si heterojunction
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/22/10.1063/1.2745254
10.1063/1.2745254
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