banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Strained single-crystal grown layer by layer on Nb (110) thin films
Rent this article for
View: Figures


Image of FIG. 1.
FIG. 1.

Nb (110) on -plane sapphire. Top: RHEED images along the (a) [001] and (b) azimuths after growth at , and (c) after annealing above . Left: AFM image of annealed Nb, height scale. Right: XRD radial scan of the Nb (110) Bragg peak.

Image of FIG. 2.
FIG. 2.

Top: RHEED images from epitaxial on Nb (110), taken along the azimuth after deposition of (a) , (b) , and (c) . Bottom: AFM scans on films that are (left, height scale) and (right, ) thick.

Image of FIG. 3.
FIG. 3.

Strain vs film thickness for epitaxial on Nb (110). (●) Strain of a film measured during deposition. (◇) Strain observed for a number of samples after deposition and cooling, with error bars indicating the range of strain values measured along different RHEED azimuths.

Image of FIG. 4.
FIG. 4.

(Color online) XRD pole figure for an epitaxial trilayer grown on -plane sapphire. Both Nb layers have a (110) surface orientation. This scan shows the off-axis ⟨110⟩ Bragg peaks. The four peaks connected by the dashed rectangle are approximately four times stronger than the others.


Article metrics loading...


Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Strained single-crystal Al2O3 grown layer by layer on Nb (110) thin films