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On the through-thickness critical current density of an film containing a high density of insulating, vortex-pinning nanoprecipitates
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10.1063/1.2749437
/content/aip/journal/apl/90/25/10.1063/1.2749437
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/25/10.1063/1.2749437
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Self-field data as a function of the residual thickness after ion milling. The solid line represents . The inset shows the critical current per unit width , which exhibits a linear dependence on with a nonzero intercept at zero .

Image of FIG. 2.
FIG. 2.

(a) at for different thicknesses. curves for a YBCO film grown by PLD on a single crystal LSAT substrate (Ref. 24) and for a YBCO film made by MOD on a single YSZ crystal (Refs. 16 and 21) are shown for comparison. The inset shows the irreversibility field , determined at , as a function of . (b) Bulk pinning force plot for different thicknesses. The inset shows that the normalized pinning force curves do not change as thickness changes.

Image of FIG. 3.
FIG. 3.

(a) Cross-sectional TEM image shows a high density of randomly distributed Y211 nanoprecipitates. (b) Close-up view near the interface layer. Additional defects are present near the interface, especially higher density of stacking faults. (Some stacking faults, Y211 precipitates, and threading dislocations are labeled.) The YBCO matrix is highly distorted because of tangled stacking faults with Y211 precipitates and threading dislocations, producing high strain fields and lattice buckling.

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/content/aip/journal/apl/90/25/10.1063/1.2749437
2007-06-18
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: On the through-thickness critical current density of an YBa2Cu3O7−x film containing a high density of insulating, vortex-pinning nanoprecipitates
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/25/10.1063/1.2749437
10.1063/1.2749437
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