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Imaging of thermal domains in ultrathin NbN films for hot electron bolometers
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10.1063/1.2751109
/content/aip/journal/apl/90/25/10.1063/1.2751109
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/25/10.1063/1.2751109
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) NbN HEB layout: wide NbN strip, partially covered by Au pads with separation. (b) characteristic measured at in the LTSEM. Open diamond and circle show bias points for LTSEM images shown in Figs. 2 and 3, respectively.

Image of FIG. 2.
FIG. 2.

(a) Nonhysteretic IVCs for e-beam irradiation on the center of the device ( from ; ); unirradiated hysteretic IVC is shown for comparison (arrows indicate sweep direction of ). (b)–(d) LTSEM voltage images (, i.e., just below , ) for different : (b) , (c) , and (d) . The rectangles mark the boundaries of the sample [cf. dashed box in Fig. 1(a)].

Image of FIG. 3.
FIG. 3.

(a) LTSEM voltage image at (stable hot spot condition); , . Dark areas indicate high voltage responsivity to e-beam irradiation. (b) Line scan of LTSEM voltage signal (solid curve) along the dashed line in (a) and comparison with model calculation using two-dimensional FEM techniques (dashed curve). Inset indicates the transition between superconducting (S) and normal (N) region at .

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/content/aip/journal/apl/90/25/10.1063/1.2751109
2007-06-21
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Imaging of thermal domains in ultrathin NbN films for hot electron bolometers
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/25/10.1063/1.2751109
10.1063/1.2751109
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