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(Color online) (a) Schematic illustration of the radial superlattice formation by the roll-up of a Au and a Cr layer stack. (b) SEM of hybrid radial superlattice with a diameter of .
(a) HAADF-STEM cross-section image of a nominal Au superlattice. (b) ADF-STEM cross-section image of the superlattice. (c) HRTEM image of the superlattice. Four distinct regions are marked in the image: (1) first amorphous interface, (2) polycrystalline Cr layers, (3) second amorphous interface, and (4) the single-crystalline bilayer indicated by the lattice fringes of the zinc blende crystal. Only one lattice plane is identifiable due to a misalignment of the zone axis.
Electron diffraction pattern obtained from a section of a single-crystalline/polycrystalline/amorphous superlattice. The diffraction rings are all indexed to the polycrystalline Cr. The elongated diffraction spots are indexed to the curved semiconductor crystal.
(Color online) Chemical analysis of a 13-period superlattice. The semiconductor is oxide-free, whereas the Cr layer is partially oxidized. The upper left inset shows the ADF-STEM image of the layer stack and the line along which EDX and EELS analyses were performed. The interface is clearly visible in this image. The upper right inset shows the high-resolution EEL signal for Cr and O.
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