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Interfaces in semiconductor/metal radial superlattices
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10.1063/1.2742323
/content/aip/journal/apl/90/26/10.1063/1.2742323
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/26/10.1063/1.2742323
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) (a) Schematic illustration of the radial superlattice formation by the roll-up of a Au and a Cr layer stack. (b) SEM of hybrid radial superlattice with a diameter of .

Image of FIG. 2.
FIG. 2.

(a) HAADF-STEM cross-section image of a nominal Au superlattice. (b) ADF-STEM cross-section image of the superlattice. (c) HRTEM image of the superlattice. Four distinct regions are marked in the image: (1) first amorphous interface, (2) polycrystalline Cr layers, (3) second amorphous interface, and (4) the single-crystalline bilayer indicated by the lattice fringes of the zinc blende crystal. Only one lattice plane is identifiable due to a misalignment of the zone axis.

Image of FIG. 3.
FIG. 3.

Electron diffraction pattern obtained from a section of a single-crystalline/polycrystalline/amorphous superlattice. The diffraction rings are all indexed to the polycrystalline Cr. The elongated diffraction spots are indexed to the curved semiconductor crystal.

Image of FIG. 4.
FIG. 4.

(Color online) Chemical analysis of a 13-period superlattice. The semiconductor is oxide-free, whereas the Cr layer is partially oxidized. The upper left inset shows the ADF-STEM image of the layer stack and the line along which EDX and EELS analyses were performed. The interface is clearly visible in this image. The upper right inset shows the high-resolution EEL signal for Cr and O.

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/content/aip/journal/apl/90/26/10.1063/1.2742323
2007-06-26
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Interfaces in semiconductor/metal radial superlattices
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/26/10.1063/1.2742323
10.1063/1.2742323
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