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Defect generation at the interface following corona charging
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10.1063/1.2749867
/content/aip/journal/apl/90/26/10.1063/1.2749867
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/26/10.1063/1.2749867
/content/aip/journal/apl/90/26/10.1063/1.2749867
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/content/aip/journal/apl/90/26/10.1063/1.2749867
2007-06-28
2014-09-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Defect generation at the Si–SiO2 interface following corona charging
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/26/10.1063/1.2749867
10.1063/1.2749867
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