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Use of real-time Fourier transform infrared reflectivity as an in situ monitor of film deposition and processing
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10.1063/1.2753118
/content/aip/journal/apl/90/26/10.1063/1.2753118
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/26/10.1063/1.2753118
/content/aip/journal/apl/90/26/10.1063/1.2753118
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/content/aip/journal/apl/90/26/10.1063/1.2753118
2007-06-29
2014-10-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Use of real-time Fourier transform infrared reflectivity as an in situ monitor of YBa2Cu3O7 film deposition and processing
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/26/10.1063/1.2753118
10.1063/1.2753118
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