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Growth, structural, and magnetic characterizations of nanocrystalline thin films
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10.1063/1.2430920
/content/aip/journal/apl/90/3/10.1063/1.2430920
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/3/10.1063/1.2430920
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) Characterization of the thick film deposited at on Si(100) by dual ion beam sputtering. (a) XRD pattern acquired at grazing incidence (i.e., 1°) with respect to the surface plane. (b) RBS experimental (symbols) and simulated (continuos line) spectra acquired at . The scattering energies for N, Si, Fe, Ni, and W are indicated.

Image of FIG. 2.
FIG. 2.

(Color online) Magnetic properties of the film. (a) Easy-axis (i.e., ) and hard-axes (i.e., ) in-plane resolved hysteresis loops, as labeled. (b) Angular dependence of the reduced magnetization remanence (symbols) compared with the behavior (line) expected for uniaxial anisotropy systems.

Image of FIG. 3.
FIG. 3.

(Color online) XMCD spectra of the film at (a) and (b) absorption edges. The data are normalized to the total absorption and corrected for the incomplete circular polarization and the out-of-grazing incidence of the photons. The integrated XMCD signals used for the sum rule analysis (dashed lines) are also displayed.

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/content/aip/journal/apl/90/3/10.1063/1.2430920
2007-01-18
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Growth, structural, and magnetic characterizations of nanocrystalline γ′-FeNiN(220) thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/3/10.1063/1.2430920
10.1063/1.2430920
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