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Buckling characterization of vertical ZnO nanowires using nanoindentation
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10.1063/1.2431785
/content/aip/journal/apl/90/3/10.1063/1.2431785
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/3/10.1063/1.2431785

Figures

Image of FIG. 1.
FIG. 1.

FESEM images of (a) sample A with the -diameter ZnO NWs, and (b) sample B with the -diameter ones.

Image of FIG. 2.
FIG. 2.

Room temperature PL spectra of the as-grown ZnO NWs (samples A and B). Inset exhibits XRD spectra for samples A and B.

Image of FIG. 3.
FIG. 3.

Force vs displacement curve of sample A (a) and sample B (b). Inset shows a FESEM image of the buckled ZnO NWs (sample B) in top view.

Tables

Generic image for table
Table I.

Critical stress, critical buckling strain, and Young’s modulus of the ZnO NWs.

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/content/aip/journal/apl/90/3/10.1063/1.2431785
2007-01-17
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Buckling characterization of vertical ZnO nanowires using nanoindentation
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/3/10.1063/1.2431785
10.1063/1.2431785
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