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X-ray diffraction patterns of and nanorods. Insets present SEM images of nanorods; (a) , (b) , and (c) TEM picture of the nanorod tip.
O -edge XANES spectra of and nanorods. Upper inset presents background corrected and features and the lower inset displays Ru and Ir -edge XANES spectra.
Fourier transform spectra of EXAFS data from at Ru - and Ir -edge of and nanorods. Inset shows EXAFS oscillations.
Valence-band PES of and nanorods from selected regions of tips (t1)–(t3) and sidewalls (s1)–(s3), as displayed in SPEM images (upper insets). The lower inset compares PES data from the tip regions of and nanorods.
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