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C XPS core level spectra of reconstructed (100) surfaces after BEN. (a) sample 1, (b) sample 2, (c) sample 3, and (d) sample 4 (see Table I). The components , , , and are discussed in the text.
FEG-SEM pictures of diamond crystallites nucleated at the surface of Si-rich and C-terminated surfaces after BEN: (a) sample 1, (b) sample 2, (c) sample 3, and (d) sample 4. The corresponding nucleation density and surface coverage are given in Table I.
CVD parameters and XAES, XPS, and FEG-SEM results (nucleation density and surface coverage ). The XPS ratio represents the ratio of the integrated intensity of the diamond C component over the total integrated intensity of all C components.
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