No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Structures and dielectric properties of (, 0.05, and 0.10) thin films
4.X. Wang, H. Wang, and X. Yao, J. Am. Ceram. Soc. 80, 2754 (1997).
6.I. Levin, T. G. Amos, J. C. Nino, T. A. Vanderah, I. M. Reancy, C. A. Randall, and M. T. Lanagan, J. Mater. Res. 17, 1406 (2002).
7.J. C. Nino, M. T. Lanagan, and C. A. Randall, J. Mater. Res. 16, 1460 (2001).
14.W. Eerenstein, F. D. Morrison, J. Dho, M. G. Blamire, J. F. Scott, and N. D. Mathur, Science 307, 1203a (2005).
Article metrics loading...
Full text loading...
Most read this month