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Structures and dielectric properties of (, 0.05, and 0.10) thin films
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10.1063/1.2433762
/content/aip/journal/apl/90/4/10.1063/1.2433762
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/4/10.1063/1.2433762
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

XRD pattern of the films on Pt coated Si substrates.

Image of FIG. 2.
FIG. 2.

Typical surface and cross-section microstructures of the BZN films.

Image of FIG. 3.
FIG. 3.

(Color online) Temperature dependent dielectric constant and loss tangent of the (a) BZN, (b) BZNT5, and (c) BZNT10 films.

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/content/aip/journal/apl/90/4/10.1063/1.2433762
2007-01-22
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Structures and dielectric properties of Bi1.5Zn1.0Nb1.5−xTixO7 (x=0, 0.05, and 0.10) thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/4/10.1063/1.2433762
10.1063/1.2433762
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