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Comment on “Influence of indium-tin-oxide thin-film quality on reverse leakage current of indium-tin-oxide/ Schottky contacts” [Appl. Phys. Lett.89, 033503 (2006)]
1.R. X. Wang, S. J. Xu, A. B. Djurišić, C. D. Beling, C. K. Cheung, D. G. Zhao, H. Yang, and X. M. Tao, Appl. Phys. Lett. 89, 033503 (2006).
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