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Multidirectional observation of an embedded quantum dot
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10.1063/1.2436633
/content/aip/journal/apl/90/4/10.1063/1.2436633
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/4/10.1063/1.2436633
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Figures

Image of FIG. 1.
FIG. 1.

(Color online) FIB sampling process. (a) TEM images observed with the incident beam parallel to the [110] and directions are listed on the right of the illustration. The black image at the topmost layer is a tungsten layer. An about thick amorphous GaAs wall is formed by the FIB process. The size of the initial pillar structure is about . (b) The width along the direction is reduced by the FIB after a desired dot is selected (white arrow). (c) Next, the width along the [110] direction is reduced in order to extract the single dot.

Image of FIG. 2.
FIG. 2.

Multidirectional TEM images of a single QD placed at the center of a micropillar. Low-magnification TEM images of the pillar sample observed with the incident beam parallel to the [110] and directions are shown in (a) and (b), respectively. (c) and (d) are high resolution TEM images corresponding to (a) and (b), respectively.

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/content/aip/journal/apl/90/4/10.1063/1.2436633
2007-01-24
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Multidirectional observation of an embedded quantum dot
http://aip.metastore.ingenta.com/content/aip/journal/apl/90/4/10.1063/1.2436633
10.1063/1.2436633
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